Latest Information
April 30, 2009 at 2:51 PM
Uniscan Instruments announce a new addition to their series of Technical Sales Supplements
A new Technical Sales Supplement (TSS #10) has been published to demonstrate the use of topographic measurements in conjunction with scanning electrochemical microscopy for sensor applications.
Application of the scanning electrochemical microscopy (SECM) technique to sensors or electrodes can provide invaluable information. Providing a high resolution view of the sensor’s activity or conductivity across the surface of the sensor can help the development of higher sensitivity sensors and sensors with greater reproducibility. Key to the measurement of electrochemical activity using the SECM technique is the ability to maintain in close proximity to the surface during a scan. The combination of the Optical-Surface Profiling (OSP) technique with the SECM allows a user to take a measure of the surface features and relieve the SECM probe’s position during the scan and effectively remove the effects of topology resulting in an artefact-free measure of the electrochemical activity.
The TSS entitled “OSP-SECM Height Relief. Application: Sensors & Electrodes” is available from Uniscan Instruments.
