Electrochemistry instrumentation by Uniscan Instruments  
Uniscan Instruments. World leaders in electrochemical and electrochemistry instrumentation
 
Scanning Measurement Technology

Model 370 Scanning Electrochemical WorkstationSECM, scanning electrochemical microscope workstation

The Model 370 Scanning Electrochemical Workstation is a new concept in Scanning Probe Electrochemistry, designed for ultra-high resolution, spatially resolved electrochemical measurements.

The Model 370 is a configurable system which will perform all the key Scanning Probe Electrochemical Techniques.

  • Scanning Electrochemical Microscopy (SECM).
  • Scanning Vibrating Electrode Technique (SVET).
  • Scanning Kelvin Probe (SKP).
  • Localised Electrochemical Impedance Spectroscopy (LEIS).
  • Scanning Droplet System (SDS).
  • Surface Topography (OSP).

The Model 370 utilises a fast and precise, closed loop x, y, z positioning system with nanometer resolution, along with a flexible data acquisition system enabling the user to select the configuration most suited to their experiments. The system is designed with flexibility in mind and the design ergonomics ensure convenient cell, sample and probe access.

The Model 370 is available in any or all of the six configurations (SECM, SVET, SKP, LEIS, SDS, OSP) and may be upgraded at a later date by subsequent purchase of any or all of the available options.

A wide variety of optional accessories are available, including various probe options, cell options (Environmental TriCell™ and µTriCell™), long working distance optical video microscope (VCAM2), and 3D shaded surface rendering software (IsoPlot™). The ability to configure to a specific application, and upgrade at a later date, makes the Model 370 uniquely flexible, whilst maintaining ultimate performance.

Scanning microscope 370

The Model 370 control and analysis software is Windows™ 32 bit MDI with the following features as standard.

  • User defined scan parameters (displacement, velocity, step scan/continuous scan mode, step size, number of data points).
  • Direct real-time readout of displacement in x, y and z via 100nm linear encoders.
  • Post data acquisition x,y,z measurement at any point.
  • Surface maps acquired at up to 70,000 data points in each axis.
  • Height tracking in any map experiment using topography data from any source (SKP topography, OSP or Constant current SECM macro).
  • Fully programmable macro language for non-standard experiments.
  • Easy to use, user configurable visual templates.
  • User definable 16,777,216 colour palette via easy to use palette editor.
  • ASCII exportable data files.
  • Full Windows™ clipboard support.

Further Information

Details of the Model 370 are available, please take a few moments to complete the form below:

Existing users may download the latest software available by clicking here

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Uniscan Instruments Ltd
Sigma House
Burlow Road
Buxton
SK17 9JB
United Kingdom
Tel: +44 (0)1298 70981