Electrochemistry instrumentation by Uniscan Instruments  
Uniscan Instruments. World leaders in electrochemical and electrochemistry instrumentation
 
Instrument Measurement Technology

Laser Profilometer - Surface TopographyOSP500LM 3D Profilometer

The Uniscan 3D Laser Profilometer, model OSP500LM is designed for very fast, high accuracy non-contact measurement of surface topography profile, form and texture measurement over large area's. Utilising a laser displacement sensor, the OSP500LM measures surface topography in the range 10's of millimeters to sub-micrometers, over area's up to 500mm x 500mm.

Applications of the Uniscan OSP500LM 3D Non-Contact Surface Profiling system include large area roughness measurement, surface digitisation for mould texturing, in-tray inspection, and any other application that requires fast, large area, accurate surface profiling.

The OSP500LM 3D Non-Contact Surface Profiling system utilises precision linear motors to scan a highly accurate laser displacement measuring device over the sample surface at speeds of up to one meter per second, collecting surface profile data at up to one sample per micrometer over the entire surface scan area. Non-contact surface profile measurements can be recorded with data density of up to 256,000 data points per line of data, and 3D non-contact surface profiling area maps at many giga samples per map.Surface Profiling software

All non-contact surface measurement scanning and data acquisition parameters are controlled by the Windows™ 32 bit MDI software. Real time surface topography data is displayed in graph and colour contour formats. Accurate laser profilometer probe positioning is achieved using linear encoders on all scan axes. Post acquisition analysis on recorded non-contact surface measurement profiles includes digital filtering options, tilt removal, arithmetic, statistics and auto-thresholding. The stored surface profile data matrices can be exported directly to other software or computer aided manufacturing (CAM) systems in a variety of formats.

Further Information

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